International Journal
| 2025 | Jang, J. & Kim, C. O. Teacher–Explorer–Student Learning: A Novel Learning Method for Open Set Recognition. IEEE Transactions on Neural Networks and Learning Systems, vol. 36, no. 1, pp. 767-780, Jan. 2025 |
| 2025 | Kwon, S., Jang, J., & Kim, C. O., Credit scoring using multi-task Siamese neural network for improving prediction performance and stability. Expert Systems with Applications, Volume 259, 1 January 2025, 125327 |
| 2024 | Lee, Y., Kim, Y., Lee. B., & Kim, C. O., Discovery of Fault-Introducing Tool Groups with a Numerical Association Rule Mining Method in Printed Circuit Board Production Line. International Journal of Production Research, Vol. 62, No. 9, 3305-3319, 2024 |
| 2024 | Choi, Y. J., Lee, G. T., Kim, C. O. SAFE: Unsupervised image feature extraction using self-attention based feature extraction network. Expert Systems, Volume 41, Issue 8 Special Issue: Computing, Intelligence and Data Analytics for Wisdom |
| 2024 | Jang, J., & Kim, C. O., Collective decision of one-vs-rest networks for open-set recognition. IEEE Transactions on Neural Networks and Learning Systems, vol. 35, no. 2, pp. 2327-2338, 2024 |
| 2023 | Hwang, H. J., Jang, J., Choi, J., Bae, J. H., Kim, S. H., & Kim, C. O. Stepwise Soft Actor–Critic for UAV Autonomous Flight Control. Drones, 7(9), 549, 2023 |
| 2023 | Choi, J., Kim, H.M., Hwang, H.J., Kim, Y.-D., & Kim, C.O., Modular Reinforcement Learning for Autonomous UAV Flight Control. Drones, 7(7), 418, 2023 |
| 2023 | Joo, J., Yang, K. W., Choi, Y. J., Min, B., & Kim, C. O., Virtual Metrology Modeling for Wafer Edges via Graph Attention Networks. IEEE Transactions on Semiconductor Manufacturing, Vol. 36, No. 3, 359-366, 2023 |
| 2023 | Lim, H. G., Jang, J., Ju, B. K., Ko, J. W., & Kim, C. O., A test vector selection method based on machine learning for efficient presilicon verification. Expert Systems with Applications, 224, 120056, 2023 |
| 2022 | An, D. W., Kim, S., Kim, H. K., & Kim, C. O., Commonality analysis for detecting failures caused by inspection tools in semiconductor manufacturing processes. IEEE Transactions on Semiconductor Manufacturing, Vol. 35, No. 4, 596-604, 2022 |
| 2022 | Shin, H. S., Kim, Y., Kim, C. O., & Park, S. H., Unsupervised novelty pattern classification of shmoo plots for visualizing the test results of integrated circuits. Expert Systems with Applications, 202, 117341, 2022 |
| 2022 | Lee, M. Y., Choi, Y. J., Lee, G. T., Choi, J., & Kim, C. O., Attention mechanism-based root cause analysis for semiconductor yield enhancement considering the order of manufacturing processes. IEEE Transactions on Semiconductor Manufacturing, 35(2), 282-290, 2022 |
| 2022 | Jang, J., & Kim, C. O., Siamese Network-Based Health Representation Learning and Robust Reference-Based Remaining Useful Life Prediction. IEEE Transactions on Industrial Informatics, Vol.18, No.8, 5264-5274, 2022 |
| 2022 | Min, B., & Kim, C. O., State-Dependent Parameter Tuning of the Apparent Tardiness Cost Dispatching Rule Using Deep Reinforcement Learning. IEEE Access, 10, 20187-20198, 2022 |
| 2022 | Heo, T., Kim, Y., & Kim, C. O., A Modified Lasso Model for Yield Analysis Considering the Interaction Effect in a Multistage Manufacturing Line. IEEE Transactions on Semiconductor Manufacturing, Vol.35, No.1, 32-39, 2022 |
| 2022 | Jang, J., & Kim, C. O., Unstructured borderline self-organizing map: Learning highly imbalanced, high-dimensional datasets for fault detection. Expert Systems with Applications, 188, 116028, 2022 |
| 2021 | Kim, S., Jang, J., & Kim, C. O., A run-to-run controller for a chemical mechanical planarization process using least squares generative adversarial networks. Journal of Intelligent Manufacturing, 32(8), 2267-2280, 2021 |
| 2021 | Kim, Y., Lee, H., & Kim, C. O., A variational autoencoder for a semiconductor fault detection model robust to process drift due to incomplete maintenance. Journal of Intelligent Manufacturing, 2021 |
| 2021 | Lee, G. T., Kim, C. O., & Song, M., Semisupervised sentiment analysis method for online text reviews. Journal of Information Science, 47(3), 387-403, 2021 |
| 2021 | Park, S., Jang, J., & Kim, C. O., Discriminative feature learning and cluster-based defect label reconstruction for reducing uncertainty in wafer bin map labels. Journal of Intelligent Manufacturing, 32(1), 251-263, 2021 |
| 2020 | Lee, G. T., & Kim, C. O., Autonomous Control of Combat Unmanned Aerial Vehicles to Evade Surface-to-Air Missiles Using Deep Reinforcement Learning. IEEE Access, 8, 226724-226736, 2020 |
| 2020 | Jang, J., Seo, M., & Kim, C. O., Support weighted ensemble model for open set recognition of wafer map defects. IEEE Transactions on Semiconductor Manufacturing, 33(4), 635-643, 2020 |
| 2020 | Lee, K. B., & Kim, C. O., Recurrent feature-incorporated convolutional neural network for virtual metrology of the chemical mechanical planarization process. Journal of Intelligent Manufacturing, 31(1), 73-86, 2020 |
| 2019 | Kim, S. J., Yoon, H. G., Lee, K. B., Kim, C. O., & Kim, S. J., Hybrid overlay modeling for field-by-field error correction in the photolithography process. IEEE Transactions on Semiconductor Manufacturing, 33(1), 53-61, 2019 |
| 2019 | Jang, J., Min, B. W., & Kim, C. O., Denoised residual trace analysis for monitoring semiconductor process faults. IEEE Transactions on Semiconductor Manufacturing, 32(3), 293-301, 2019 |
| 2019 | Jang, J., Yoon, H. G., Kim, J. C., & Kim, C. O., Adaptive weapon-to-target assignment model based on the real-time prediction of hit probability. IEEE Access, 7, 72210-72220, 2019 |
| 2019 | Lee, K. B., & Kim, C. O., Marker layout for optimizing the overlay alignment in a photolithography process. IEEE Transactions on Semiconductor Manufacturing, 32(2), 212-219, 2019 |
| 2019 | Cheon, S., Lee, H., Kim, C. O., & Lee, S. H., Convolutional neural network for wafer surface defect classification and the detection of unknown defect class. IEEE Transactions on Semiconductor Manufacturing, 32(2), 163-170, 2019 |
| 2019 | Kwak, J., Lee, K. B., Jang, J., Chang, K. S., & Kim, C. O., Automatic inspection of salt-and-pepper defects in OLED panels using image processing and control chart techniques. Journal of Intelligent Manufacturing, 30(3), 1047-1055, 2019 |
| 2019 | Lee, H., Lim, J., Lee, K., & Kim, C. O., Agent simulation-based ordinal optimisation for new product design. Journal of the Operational Research Society, 70(3), 502-515, 2019 |
| 2017 | Lee, K. B., Cheon, S., & Kim, C. O., A convolutional neural network for fault classification and diagnosis in semiconductor manufacturing processes. IEEE Transactions on Semiconductor Manufacturing, 30(2), 135-142, 2017 |
| 2017 | Lee, H., Choi, B. J., Kim, C. O., Kim, J. S., & Kim, J. E., Threat evaluation of enemy air fighters via neural network-based Markov chain modeling. Knowledge-Based Systems, 116, 49-57, 2017 |
| 2016 | Lee, H., Kim, Y., & Kim, C. O., A deep learning model for robust wafer fault monitoring with sensor measurement noise. IEEE Transactions on Semiconductor Manufacturing, 30(1), 23-31, 2016 |
| 2016 | Lee, T., Lee, K. B., & Kim, C. O., Performance of machine learning algorithms for class-imbalanced process fault detection problems. IEEE Transactions on Semiconductor Manufacturing, 29(4), 436-445, 2016 |
| 2016 | Yoon, H. G., Kim, H., Kim, C. O., & Song, M., Opinion polarity detection in Twitter data combining shrinkage regression and topic modeling. Journal of Informetrics, 10(2), 634-644, 2016 |
| 2015 | Lee, H., Kim, C. O., Ko, H. H., & Kim, M. K., Yield prediction through the event sequence analysis of the die attach process. IEEE Transactions on Semiconductor Manufacturing, 28(4), 563-570, 2015 |
| 2015 | Kwak, J., Lee, T., & Kim, C. O., An incremental clustering-based fault detection algorithm for class-imbalanced process data. IEEE Transactions on Semiconductor Manufacturing, 28(3), 318-328, 2015 |
| 2015 | Kim, J., Kim, C. O., & Kwak, C., Analysis of timeout mechanism in a testing-repair model. International Journal of Production Research, 53(7), 1996-2010, 2015 |
| 2015 | Lee, H., Kwak, J., Song, M., & Kim, C. O., Coherence analysis of research and education using topic modeling. Scientometrics, 102(2), 1119-1137, 2015 |
| 2014 | Lee, T., & Kim, C. O., Statistical comparison of fault detection models for semiconductor manufacturing processes. IEEE Transactions on Semiconductor Manufacturing, 28(1), 80-91, 2014 |
| 2014 | Sim, H., Choi, D., & Kim, C. O., A data mining approach to the causal analysis of product faults in multi-stage PCB manufacturing. International journal of precision engineering and manufacturing, 15(8), 1563-1573, 2014 |
| 2014 | Lee, K., Lee, H., & Kim, C. O., Pricing and timing strategies for new product using agent-based simulation of behavioural consumers. Journal of Artificial Societies and Social Simulation, 17(2), 1, 2014 |
| 2014 | Kim, S. T., Hong, S. R., & Kim, C. O., Product attribute design using an agent-based simulation of an artificial market. International journal of simulation modelling, 13(3), 288-299, 2014 |
| 2013 | Lee, K., Kim, S., Kim, C. O., & Park, T., An agent-based competitive product diffusion model for the estimation and sensitivity analysis of social network structure and purchase time distribution. Journal of Artificial Societies and Social Simulation, 16(1), 3, 2013 |
| 2013 | Ko, J. M., Hong, S. R., Choi, J. Y., & Kim, C. O., Wafer-to-wafer process fault detection using data stream mining techniques. International Journal of Precision Engineering and Manufacturing, 14(1), 103-113, 2013 |
| 2012 | Ko, J. M., & Kim, C. O., A multivariate parameter trace analysis for online fault detection in a semiconductor etch tool. International journal of production research, 50(23), 6639-6654, 2012 |
| 2012 | Park, T., Lee, T., & Kim, C. O., Due-date scheduling on parallel machines with job splitting and sequence-dependent major/minor setup times. The International Journal of Advanced Manufacturing Technology, 59(1), 325-333, 2012 |
| 2011 | Kwak, C., Park, E., & Kim, C. O., |
| 2011 | Kim, S., Lee, K., Cho, J. K., & Kim, C. O., Agent-based diffusion model for an automobile market with fuzzy TOPSIS-based product adoption process. Expert Systems with Applications, 38(6), 7270-7276, 2011 |
| 2011 | Ko, J. M., Kwak, C., Cho, Y., & Kim, C. O., Adaptive product tracking in RFID-enabled large-scale supply chain. Expert systems with applications, 38(3), 1583-1590, 2011 |
| 2010 | Ko, J. M., Kim, C. O., Lee, S. J., & Hong, J. P., Structural feature-based fault-detection approach for the recipes of similar products. IEEE transactions on semiconductor manufacturing, 23(2), 273-283, 2010 |
| 2010 | Hong, S. R., Kim, S. T., & Kim, C. O., Neural network controller with on-line inventory feedback data in RFID-enabled supply chain. International Journal of Production Research, 48(9), 2613-2632, 2010 |
| 2010 | Shin, K. H., Kwon, I. H., Lee, J. H., & Kim, C. O., Performance trajectory-based optimised supply chain dynamics. International Journal of Computer Integrated Manufacturing, 23(1), 87-100, 2010 |
| 2010 | Kim, C. O., Kwon, I. H., & Kwak, C., Multi-agent based distributed inventory control model. Expert Systems with Applications, 37(7), 5186-5191, 2010 |
| 2009 | Kwak, C., Choi, J. S., Kim, C. O., & Kwon, I. H., Situation reactive approach to Vendor Managed Inventory problem. Expert Systems with Applications, 36(5), 9039-9045, 2009 |
| 2009 | Woo, S. H., Choi, J. Y., Kwak, C., & Kim, C. O., An active product state tracking architecture in logistics sensor networks. Computers in Industry, 60(3), 149-160, 2009 |
| 2009 | Yoo, J. S., Hong, S. R., & Kim, C. O., Service level management of nonstationary supply chain using direct neural network controller. Expert Systems with applications, 36(2), 3574-3586, 2009 |
| 2009 | Kwak, C., & Kim, C. O., A multicriteria approach to timeout collaboration protocol. International journal of production research, 47(22), 6417-6432, 2009 |
| 2008 | Ko, J. M., Kim, C. O., & Kwon, I. H., Quality-of-service oriented web service composition algorithm and planning architecture. Journal of Systems and Software, 81(11), 2079-2090, 2008 |
| 2008 | Kim, M. C., Kim, C. O., Hong, S. R., & Kwon, I. H., Forward–backward analysis of RFID-enabled supply chain using fuzzy cognitive map and genetic algorithm. Expert Systems with Applications, 35(3), 1166-1176, 2008 |
| 2008 | Kwon, I. H., Kim, C. O., Jun, J., & Lee, J. H., Case-based myopic reinforcement learning for satisfying target service level in supply chain. Expert Systems with Applications, 35(1-2), 389-397, 2008 |
| 2008 | Kwon, I. H., Kim, C. O., Kim, K. P., & Kwak, C., Recommendation of e-commerce sites by matching category-based buyer query and product e-catalogs. Computers in Industry, 59(4), 380-394, 2008 |
| 2008 | Lee, J. H., & Kim, C. O., Multi-agent systems applications in manufacturing systems and supply chain management: a review paper. International Journal of Production Research, 46(1), 233-265, 2008 |
| 2008 | Kim, C. O., Kwon, I. H., & Baek, J. G., Asynchronous action-reward learning for nonstationary serial supply chain inventory control. Applied Intelligence, 28(1), 1-16, 2008 |
| 2007 | Baek, J. G., & Kim, C. O., Learning single-issue negotiation strategies using hierarchical clustering method. Expert Systems with Applications, 32(2), 606-615, 2007 |
| 2006 | Baek, J. G., Kim, C. O., & Kwon, I. H., An adaptive inventory control model for a supply chain with nonstationary customer demands. In Pacific Rim International Conference on Artificial Intelligence (pp. 895-900), 2006 |
| 2006 | Kim, C. O., Baek, J. G., & Jun, J., Meta-model driven collaborative object analysis process for production planning and scheduling domain. In International Conference on Computational Science and Its Applications (pp. 839-850), 2006 |
| 2005 | Kim, C. O., Cho, Y. H., Yoon, J. U., Kwak, C. J., & Seo, Y. H., Ontology based negotiation case search system for the resolution of exceptions in collaborative production planning. In OTM Confederated International Conferences" On the Move to Meaningful Internet Systems" (pp. 24-25), 2005 |
| 2005 | Kim, C. O., Jun, J., Baek, J. K., Smith, R. L., & Kim, Y. D., Adaptive inventory control models for supply chain management. The International Journal of Advanced Manufacturing Technology, 26(9), 1184-1192, 2005 |
| 2005 | Kim, C. O., Baek, J. G., & Jun, J., A machine cell formation algorithm for simultaneously minimising machine workload imbalances and inter-cell part movements. The International Journal of Advanced Manufacturing Technology, 26(3), 268-275, 2005 |
| 2005 | Kim, C. O., Park, Y., & Baek, J. G., Optimal signal control using adaptive dynamic programming. International Conference on Computational Science and Its Applications (pp. 148-160), 2005 |
| 2005 | Kwak, C., & Kim, C. O., Dispatching decisions within preemption procedure. International Journal of Industrial Engineering: Theory Applications and Practice, 12(1), 23-27, 2005 |
| 2004 | Kim, C. O., C., Baek, J. G., & Baek, J. K., A two-phase heuristic algorithm for cell formation problems considering alternative part routes and machine sequences. International Journal of Production Research, 42(18), 3911-3927, 2004 |
| 2003 | Kim, C. O., & Shin, H. J., Scheduling jobs on parallel machines: a restricted tabu search approach. The International Journal of Advanced Manufacturing Technology, 22(3), 278-287, 2003 |
| 2003 | Kim, S. S., Shin, H. J., Eom, D. H., & Kim, C. O., A due date density-based categorising heuristic for parallel machines scheduling. The International Journal of Advanced Manufacturing Technology, 22(9), 753-760, 2003 |
| 2002 | Kim, C. O., Jun, J., Kim, S. S., & Baek, J. K., Contract-collaboration network method for modeling manufacturing resource control workflows. Journal of Intelligent Manufacturing, 13(6), 463-475, 2002 |
| 2002 | Shin, H. J., Kim, C. O., & Kim, S. S., A tabu search algorithm for single machine scheduling with release times, due dates, and sequence-dependent set-up times. The International Journal of Advanced Manufacturing Technology, 19(11), 859-866, 2002 |
| 2002 | Baek, J. G., Kim, C. O., & Kim, S. S., Online learning of the cause-and-effect knowledge of a manufacturing process. International Journal of Production Research, 40(14), 3275-3290, 2002 |
| 2001 | Kim, C. O., & Nof, S. Y., Design of collaboration framework for distributed CIM data activities. IIE Transactions, 33(7), 535-546, 2001 |
| 2000 | Kim, C. O., & Nof, S. Y., Investigation of PVM for the emulation and simulation of a distributed CIM workflow system. International Journal of Computer Integrated Manufacturing, 13(5), 401-409, 2000 |
| 2000 | Kwon, I. M., Kim, C. O., Jun, J., & Kim, S. S., Building generic data interface components through a data object generalization pattern. JOOP-Journal of Object-Oriented Programming, 13(6), 6-10, 2000 |
| 1998 | Kim, C. O., Min, H. S., & Yih, Y., Integration of inductive learning and neural networks for multi-objective FMS scheduling. International Journal of Production Research, 36(9), 2497-2509, 1998 |
| 1998 | Min, H. S., Yih, Y., & Kim, C. O., A competitive neural network approach to multi-objective FMS scheduling. International journal of production research, 36(7), 1749-1765, 1998 |
| 1998 | Kim, C. O., & Nof, S. Y., A collaboration scheme for distributed CIM data activities. International Journal of Industrial Engineering: Theory Applications and Practice, 5(1), 68-77, 1998 |
| 1997 | Kim, C. O., & Nof, S. Y., Coordination and integration models for distributed and heterogeneous CIM information. Knowledge-Based Systems: Advanced Concepts, Techniques and Applications (pp. 587-601), 1997 |
| Joo, J., Kim, C. O. | Global Feature Identification Layer for Mixed-Type Wafer Bin Map Classification, Expert Systems with Applications, Under review |
| Lim, H. G., Jang, J., Choi, J., Kim, K. H., Kim, C. O. | Fine-tuning double exponentially weighted moving average run-to-run process control method for chemical mechanical polishing, Journal of Process Control, Submitted |
| Lee, D. R., Kim, C. O. | Long-tailed Classification Based on Dynamic Class Average Loss, Expert Systems with Applications, Submitted |
| Kong, J., Kim, C. O. | Unsupervised feature selection using multi-head attention for multivariate time series data, |
| Seo, J., Kim, C. O. | Consistency regularization-based deep semi-supervised regression model for virtual metrology of the chemical mechanical planarization process, |
| Hong, S. U., Yang, D., Jang, J., Kim, C. O. | A virtual metrology modeling framework using optical emission spectroscopy data of plasma etching, |
| Lee, K. B., Kim, C. O. | An adversarial autoencoder-based oversampling method for the class imbalance problem in semiconductor manufacturing, |
| No, Y., Kim, S. J., Kim, C. O. | Bayesian optimization-driven yield analysis using contrast set learning in multilayer ceramic capacitor manufacturing, |
